Memory Build-In Self Diagnosis (MBISD) in Memory Build-In Self Test (MBIST) technology is introduced, which is widely used in the design of testability of embedded memories.
针对大规模嵌入式存储器可测性设计技术——存储器内建自测试(MBIST)中的故障诊断问题,介绍了MBIST设计的扩展功能——存储器内建自诊断(MBISD)。
